Discover the Future of Advanced Materials Research with the HITACHI FE-SEM SU 8230
Revolutionizing Carbon and Polymer Materials Analysis for Semiconductors, Biotechnology, and Pharmaceuticals
In the world of advanced materials research, carbon and polymer materials are setting new trends. At MAS, we’re excited to introduce the HITACHI FE-SEM SU 8230, an ultra-high resolution Field Emission Scanning Electron Microscope (FE-SEM) designed to meet the diverse needs of various fields, including semiconductors, electronics, catalysts, biotechnology, and pharmaceuticals.
Why Materials Engineers and Developers Love the HITACHI FE-SEM SU 8230
The HITACHI FE-SEM SU 8230 offers several key advantages for materials engineers, polymer, and nano composite developers:
- Low Voltage Elemental Microanalysis: This feature allows for detailed analysis of elements at low voltage, reducing damage to sensitive samples.
- Increased Probe Current & Beam Stability: Ensures consistent and reliable imaging and analysis.
- Enhanced Brightness: Complements the inherent brightness for clearer images.
- High Spatial Resolution: Provides detailed images with high sensitivity and speed, particularly beneficial for X-Ray detection.
Stunning Imaging Capabilities
The HITACHI FE-SEM SU 8230 isn't just about advanced features; it delivers stunning, detailed images that are crucial for modern research in semiconductors, electronics, and biotechnology. Here are some examples:
1. Celgard Li-ion Battery Separator
- Magnification: 30,000X
- The Celgard separator, a trilayer polypropylene-polyethylene-polypropylene membrane, is non-conductive and highly sensitive to electron beam damage. Using the SU 8230 FE-SEM, the separator can be clearly observed without charging or deformation, even at an acceleration voltage of just 500V.
2. Tree Leaf Surface EDX Mapping
- Conditions: 20kV
- This technique maps elements on the tree leaf surface with colors: Oxygen (O) in Blue, Sodium (Na) in Pink, and Potassium (K) in Yellow.
3. Multiwall Carbon Nanotube (MWCT)
- Magnification: 250,000X
- Provides an incredibly detailed view of the nanotube structure, essential for nanocomposite development.
4. Lithium-ion Battery Negative Electrode
- Magnification: 100,000X
- Landing Voltage: 1kV
- Detailed imaging of the negative electrode, critical for lithium-ion battery research.
The HITACHI FE-SEM SU 8230's advanced imaging capabilities are essential in case studies like the investigation of formulation changes in materials, where precise analysis of material composition and microscopic alterations are key for ensuring quality and meeting industry standards. Learn more about this application in a related case study on aerosol analysis.
Learn More About MAS and Our Cutting-Edge Technology
MAS is dedicated to advancing materials research with state-of-the-art technology. Our new HITACHI FE-SEM SU 8230 is a testament to our commitment to meeting the specific needs of various industries, including biotechnology applications and pharmaceutical materials analysis. Learn more about our pharmaceutical testing.
For more information, contact us at:
Materials Analytical Services (MAS)
3945 Lakefield Court
Suwanee, GA 30024
Phone: 770-866-3200
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