Particles, Layer Comparisons, Failure Evaluations, Small Sample Size
Through digital optical microscopy and low voltage elemental microanalysis (SEM/EDX), MAS can evaluate surface, morphological, and chemical characteristics of a wide range of samples. Some methods are non-destructive while others will involve cross-sectioning or otherwise preparing samples for evaluation. Our automated particle size technique can be applied to product comparisons and quality control. MAS also performs PLM, PCM, TEM, and other optical microscopic techniques to analyze for asbestos and mold spores.
Scanning Electron Microscopy with Energy Dispersive X-Ray Analysis
SEM is a surface analysis technique achieved by rastering a focused electron beam and detecting secondary or backscattered electron signal. These signals provide information about surface morphology whether it is the top surface or a previously prepared cross-section. EDX detects elements present (as low as beryllium). Small particle sizing (including automated particle analysis), characterizing contaminants, and comparing layer thicknesses are a few of the applications of SEM/EDX. It is useful as a screening tool for elemental composition and surface morphology. EDX is synonymous with EDS (Energy Dispesive Spectroscopy) and EDXA (Energy Dispersive X-Ray Analysis).