Materials Analytical Services, LLC

3945 Lakefield Court

Suwanee, GA 30024

FDA Registered FEI 3011589416

DEA Registration Number RM0429147

Tel: 770-866-3200


Fax: 770-866-3259

 C.T. Schamp, Y. Suzuki, J. Fuse, K. Ito, H. Tanada, A. Kageyama, Y. Nagakubo, T. Mizuno (2017) "EBIC and EBAC Analysis of Site Specific STEM Samples." ISTFA 2017 Proceedings.


T. Sato, Y. Orai, Y. Suzuki, H. Ito, T. Isshiki, M. Fukui, K. Nakamura, C.T. Schamp (2017) "Surface morphology and dislocation characteristics near the surface of 4H-SiC wafer using multi directional scanning transmission electron microscopy." Microscopy, submitted.

J.C. Yang, S.D. House, Y. Chen, D. Su, T. Schamp, R. Henry, E. Stach, R. Jin; "Quantitative STEM Atom Counting in Supported Metal Nanoparticles." The 16th European Microscopy Congress, Lyon France.

T. Sunaoshi, K. Kaji, Y. Orai, C.T. Schamp, E. Voekl (2016) "STEM/SEM, Chemical Analysis, Atomic REsolution and Surface Imaging at ≤30kV with No Aberraction Correction for Nanomaterials on Graphene Support." Microsc Microanal 22(S3) 604-605.

S.D. House, C.T. Schamp, R. Henry, D. Su, E. Stach, and J.C. Yang (2016) Development of Real-Time Prove Current Calibration for Performing Quantitative STEM with a Cold Field-Emission Gun." Microsc Microanal, 22 (2016) No.


 J. Howe, X. Wang, M. Vara, D. Hoyle, T. Schamp, Y. Xia "Simultaneous Atomic-Resolution Secondary Electron and Transmitted electron Imaging of Nanocrystals" Proceedings of the Southeastern Microscopy Society Meeting, 35 (2015) p. 25.

 J. Howe, Y. Hashimoto, X. Wang, M. Vara, D. Hoyle, T. Schamp, Y. Xia, and D. Joy (2015) Microsc Microanal 21(S3) 1265-1266.

S.D. House, L. Li, C.T. Schamp, R. Henry, D. Su, E. Stach, J.C. Yang (2015) "Development of Quantitative STEM for a Conventional S/TEM and Real-Time Current Calibration for Performing QSTEM with a Cold Field Emission Gun." Microsc Microanal, 21(S3), 2127-2128.


M. Wormington, P.Y. Hung, M.-H. Wong, C.T. Schamp, A. Giladi, M. Klinov, W.-E. Wang, G. Bersuker, P.D. Kirsch, and R. Jammy, "Defect metrology of epitaxial Ge on patterned Si wafers using an inline HRXRD tool" 2013 NIST International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (FCMN 2013), Gaithersburg, MD, USA, Mar. 25-28, 2013.

 J.H. Nickel, J.-P. Strachan, M.D. Pickett, C.T. Schamp, J.J. Yang, J.A. Graham, R.S. Williams (2013) "Memristor structures for high scalability:  Non-linear and symmetric devices utilizing fabrication friendly materials and processes" Microelectronic Engineering, 103, 66-69

C.T. Schamp (2012) "High Resolution Metrology in the TEM." Microscopy Today, Vol 20 - No. 3.

C.T. Schamp, PY Hung, B.G. Min (2012) "An Efficient Technique to Quantify Dislocation Densities Imaged Through Annular Dark Field Scanning Transmission Electron Microscopy (STEM)."  Microsc Microanal, 18, CD.

C.T. Schamp, G. Casillas, M. Jose-Yacaman (2011) “Phase Detection Using Low-Loss EELS with Aberration Corrected STEM.” Microsc Microanal, 17, CD.

C.T. Schamp, B.T. Valdez, L.K. Ballast, A. Gill, S.A. Pierce, L. Brown, C. Brooks, E. Thompson, B. Roth (2010) “SEM Imaging of Resist Patterns Fabricated Through Imprint Lithography Techniques.” Microsc Microanal, 16, CD.

C.T. Schamp, W.S. Cheng, and W.A. Jesser (2009) “Phase Characterization of Two-Phase BiSn Alloy Nanoparticles Using Conventional TEM and EFTEM Spectral Imaging Techniques.” Microsc Microanal. 15, CD.

C.T. Schamp, R. Rios, and A. Gill (2009) “Analysis of ‘Invisible’ Poly-Bump Defect With EFTEM Spectral Imaging.” Microsc Microanal. 15, C


C.T. Schamp, B.T. Valdez, J. Gazda (2008) “Quick Sample Preparation and EFTEM Elemental Characterization of FAB Based Defects.” Microscopy Today, Vol 16 – No. 2

C.T. Schamp and B.T. Valdez (2008) “EFTEM- and STEM-EDXS Spectral imaging of ‘Hidden’ Si-based Semiconductor Device Defects.” Microsc Microanal 14, CD.

W.A. Jesser and C.T. Schamp (2008) “Nanoparticle semiconductor compositions in the miscibility gap.” Physica Status Solidi (c) 5, No. 2, 539-544

C.T. Schamp and W.A. Jesser. (2008) “Growth and characterization of GaAs-GaSb III-V pseudo-binary nanoparticles.”  Physica Status Solidi (c) 5, No. 2 545-548 

C.T. Schamp, J. Gazda, B.T. Valdez, and B. Bridgman. (2007) “Ni Catalysts for the Growth of SiO2 Nanofiber Bundles.” Microsc Microanal 13(Suppl 2), CD

Schamp, C. T., W. A. Jesser, et al. (2007). “Growth of GaAs “nano ice cream cones” by dual wavelength pulsed laser ablation.” Applied Surface Science 253(15): 6326-6329.

C.T. Schamp and W.A. Jesser. Two-Phase Equilibrium in Individual Nanoparticles of Bi-Sn, Met Trans A, 37A (2006) p.1825

C.T. Schamp and W.A. Jesser. GaAs-GaSb Pseudobinary Nanoparticles. (2005) Proc. Solid-Solid-Phase Transformations in Inorganic Materials (Phoenix), p.1029.

C.T. Schamp, V.P. Oleshko, W.A. Jesser, B.S. Shivaram, and J.M. Howe. High Resolution EFTEM and PEELS of Ga/GaAs “Nano-Ice Cream Cones” Grown by Dual-Wavelength Pulsed Laser Deposition. Proc. Microsc. Microanal. (2005) 11 (suppl.2) 1914CD.

C.T. Schamp and W.A. Jesser. On the Measurement of Lattice Parameters of Nanoparticles by Transmission Electron Diffraction, Ultramicroscopy, 1003(2005) 165

W.A. Jesser and C.T. Schamp. Misfit Accommodation by Screw Dislocations.  Transactions of the Royal Society of South Africa, 58 (2003) 135.